Khoom Description
Chip-theem ESD (Electrostatic Discharge) kev ntsuam xyuas yog qhov kev ntsuam xyuas kev ntseeg siab rau Integrated Circuits (ICs) siv los ntsuas lub nti lub peev xwm los tiv thaiv electrostatic paug cuam tshuam thaum tsim khoom, ntim khoom, kev thauj mus los, lossis siv. GRGTEST muaj ib pab neeg ua haujlwm paub tab thiab cov kws tshaj lij kev lag luam, ua kom muaj txiaj ntsig zoo rau kev kuaj ESD.
Cov ntsiab lus kev pabcuam
HBM (Tib neeg lub cev qauv), CDM (Charged Device Model), MM (Machine Model), TLP (Hloov Kab Pulse), VFTLP (Hloov ceev heev kis kab mem tes)
Kev Pabcuam Scope
Integrated Circuits (ICs), Optical Modules, Discrete Devices, Liab qab Tuag
Test Standards
- ANSI/ESDA/JEDEC JS-001:2024 Electrostatic Discharge Sensitivity Testing - Tib Neeg Lub Cev Qauv - Qib Qib
- GJB 548C-2021 Method 3015.1 Test Methods and Procedures for Microelectronic Devices
- MIL-STD-883-3:2019 Method 3015.9 Microcircuit Environmental Test Methods
- AEC-Q100-002 REV-E Tib Neeg Lub Cev Qauv Electrostatic Discharge Test
- AEC-Q101-001 REV-A Tib Neeg Lub Cev Qauv Electrostatic Discharge Test
- ANSI/ESDA/JEDEC JS-002:2022 Electrostatic Discharge Sensitivity Testing - Charged Device Model - Ntaus Qib
- AEC-Q100-011 REV-D Charged Device Model Electrostatic Discharge Sensitivity Test
- ANSI/ESD STM5.5.1-2022 Kis Kab Pulse Electrostatic Discharge Sensitivity Test
- JESD22-A115C: 2010 Tshuab Qauv Electrostatic Discharge Sensitivity Test
- GJB 128B-2021 Method 1020 Test Methods for Semiconductor Discrete Devices
- IEC 61000-4-2: 2008 Electromagnetic Compatibility (EMC) - Kev ntsuas thiab ntsuas - Kev ntsuas hluav taws xob tiv thaiv hluav taws xob
- Txoj kev tsheb - Kev sim rau kev cuam tshuam hluav taws xob los ntawm electrostatic tawm ISO 10605: 2008
Cov khoom kuaj
|
Cov cuab yeej kuaj |
Chaw tsim tshuaj paus |
Cov khoom kuaj |
|
MK.2 TSI |
Thermo Fisher |
• HBM: 30V ~ 8000V, Min. Kauj ruam 1 V |
|
MK.4 TSI |
Thermo Fisher |
• HBM: 25V ~ 8000V, Min. Kauj ruam 1 V |
|
Orion 3 |
Thermo Fisher |
• CDM: 25V ~ 2000V, Min. Kauj ruam 1 V |
|
TLP |
HPPI (Lub Tebchaws Yelemees) |
• Pulse Dav: 100ns |
|
VFTLP |
ESDEMC |
• Pulse Width: 1ns, 2.5ns, 5ns, 10ns, 100ns, 1000ns |
Kev lees paub ntsig txog
CNAS
Test Duration
3 ~ 7 Hnub Ua Haujlwm
Kev Pabcuam Tom Qab
Electrostatic paug yog ib qho tshwm sim ntawm kev tso tawm tam sim ntawd (xws li tso tawm los ntawm tib neeg kev sib cuag nrog lub nti). Nws qhov hluav taws xob tuaj yeem ncav cuag ntau txhiab volts, txaus los rhuav tshem cov nti ntawm cov txheej txheem rwb thaiv tsev los yog kev puas tsuaj rau cov transistors, ua rau kev ua haujlwm tsis ua haujlwm lossis kev ua haujlwm tsis zoo. Yog tias lub nti ua tsis tiav vim muaj teeb meem ESD tom qab daim kab xev - tawm, tus nqi rov ua haujlwm yog siab heev (tshwj xeeb tshaj yog rau cov txheej txheem siab heev). Kev ntsuam xyuas pab txheeb xyuas qhov tsis zoo thaum lub sijhawm tsim qauv, txo cov kev pheej hmoo tom qab. Raws li cov txheej txheem semiconductor nce mus rau qib nanoscale (piv txwv li, 7nm, 5nm), nrog txo qhov ntau thiab tsawg thiab kev sib xyaw ua ke, kev kam rau ESD txo qis. Kev ntsuam xyuas ESD tau dhau los ua qhov tseem ceeb lav rau kev ntseeg siab ntawm nti.
Peb Qhov Zoo
GRGTEST's ESD kev sim ua kom muaj zog ntawm lub teb chaws - chav kuaj, yog nruab nrog cov cuab yeej siv thoob ntiaj teb thiab cov kev daws teeb meem zoo, thiab tuav cov ntawv pov thawj xws li CNAS thiab CMA. Peb muab cov kev pabcuam kuaj kev tiv thaiv electrostatic zoo thiab meej, pab cov lag luam txhim kho cov khoom lag luam kev ntseeg siab thiab kev sib tw ua lag luam.
Cim npe nrov: chip-level esd test, China chip-level esd testing service provider
