TEM Imaging Thiab Analysis

TEM Imaging Thiab Analysis
Paub meej:
Transmission electron microscopy (TEM) tau dhau los ua qhov ntsuas ntsuas tsis tseem ceeb hauv cov khoom siv thiab cov khoom siv hluav taws xob. Nws yog ib qho khoom siv hluav taws xob kho qhov muag uas siv lub siab - lub zog hluav taws xob hluav taws xob ua lub teeb pom kev zoo thiab tsom cov hluav taws xob (xws li, cov khoom siv hluav taws xob xa mus) dhau los ntawm cov qauv (kwv yees li 10-150 nm tuab) los ntawm electromagnetic lo ntsiab muag los tsim cov duab. Los ntawm kev sib txuas ntau yam kev siv TEM, cov ntaub ntawv ntawm morphology, cov qauv siv lead ua, thiab cov tshuaj muaj pes tsawg leeg ntawm cov qauv tuaj yeem tau txais ib txhij. TEM daws teeb meem tuaj yeem ncav cuag 0.12 nm, thaum STEM daws teeb meem tuaj yeem ncav cuag 0.16 nm.
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Ces
Hauj lwm lawm
Kev tsis

cov ntsiab lus kev pabcuam


TEM (paj-cov duab teb, tawm-axis tsaus- cov duab teb, nruab nrab tsaus- cov duab teb, siab- cov duab daws teeb meem, tsis muaj zog- nqaj tsaus- teb duab); STEM (HAADF cov duab, DF cov duab, BF cov duab, EDS zog spectra, iDPC cov duab); diffraction (xaiv diffraction, convergent-beam diffraction, nanobeam diffraction)

 

qib kev pabcuam


Chip-cov haujlwm ntsig txog (wafer fabs, cov khoom siv hluav taws xob semiconductor, cov tuam txhab tsim chip, thiab lwm yam); Cov ntaub ntawv-cov haujlwm muaj feem xyuam (cov tsev kawm qib siab, cov chaw tshawb fawb, thiab cov khoom lag luam R&D).

 

Kuaj lub voj voog


Lub sij hawm ua haujlwm: 5-7 hnub ua haujlwm.

 

Kev Pabcuam Tom Qab


Nrog rau kev siv thev naus laus zis ntau ntxiv rau txawv teb chaws, cov tuam txhab hauv tsev siab - thev naus laus zis tau nthuav dav ntau dua rau kev ywj pheej nti R & D muaj peev xwm, uas tau ua rau muaj kev tsim khoom hauv tsev rau cov khoom siv semiconductor. Raws li cov txheej txheem tsim chip txuas ntxiv zuj zus, kev txhim kho cov chips thiab cov khoom siv semiconductor nce ntxiv rau cov cuab yeej tshuaj ntsuam xyuas microscopic xws li TEM. Transmission electron microscopy (TEM) plays lub luag haujlwm hloov tsis tau hauv kev tshawb fawb thiab kev loj hlob ntawm cov ntaub ntawv. Nws muab cov ntaub ntawv tseem ceeb hauv microscopic cov ntaub ntawv- suav nrog cov qauv siv lead ua, qhov tsis xws luag, cov khoom sib xyaw ua ke, thiab cov concentrations- uas pab hauv kev txheeb xyuas cov khoom thiab kev coj cwj pwm. Cov txheej txheem kuj

txhawb kev tshawb fawb txog theem kev hloov pauv thiab cov txheej txheem diffusion, muab cov kev nkag siab zoo rau cov khoom tsim thiab kev ua kom zoo.

 

peb qhov zoo


Guangdian Metrology tshwj xeeb hauv TEM kev tshuaj ntsuam xyuas thev naus laus zis, khav theeb kev lag luam - pab pawg kws tshaj lij thiab cov cuab yeej tshuaj ntsuam xyuas TEM siab heev (Talos F200X G2). Peb muab kev kho TEM tsom xam cov kev daws teeb meem raws li R&D xav tau ntawm ntau tus neeg siv khoom. Peb lub tuam txhab muaj FIB-TEM tsom xam muaj peev xwm rau cov txheej txheem siab txog li 7nm thiab qis dua.

 

cas share

 

product-348-348

product-526-266

 

 

Cim npe nrov: tem imaging thiab tsom xam, Tuam Tshoj tem imaging thiab tsom xam muab kev pabcuam

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